Scanning Electron Microscopy (SEM)

The SEM used in IFA is made by JEOL and enable to diagnose minute fragments and details on a surface of an element; with the magnification ability of X100,000 in respect for source. With the SEI and the BSE detectors fracture characterization of an element can be mapped. Failure analysis fracture mechanism can be determined, as well. With the EDS detector chemical diagnostics of deposit residue and material composition, can be preformed.

How do Scanning Electron Microscopy work?

Scanning electron microscope uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. On the microscopy cloumn installed are detectors that collect the electrons for imaging generation (SEI, BSE) and chemical determining compositions (EDS).
Electrons that escape from the surface of the sample, as a result of the beam energy, are being collected by the SEI detector, that transforms it in to a plot of surface topography.
Electrons from the beam that hit the atoms of the sample and return as a result from collision, are being collected by the BSE detector (these electron are characterized by higher energy than those collected by the SEI detector), that present the topography of the surface. Using one of these detectors creates an image on the SEM CRT.
Photons that are emitted due to the electron excitation, are being collected by the EDS detector that produce a plot of atomic material composition.

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